Nanosurf introduces the leading solution for correlative AFM-SEM-EDX analysis (w/video)

From Nanowerk Nanotechnology News
March 20, 2017 - 12:25am
AFSEM enables you to easily combine three of the most powerful analysis techniques available - AFM, SEM, and EDX - to greatly extend your correlative microscopy and analysis possibilities.


Continue reading this article »